DOMENICO AUGUSTO FRANCESCO MAISANO

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Associate Professor

+39 0110907281 / 7281 (DIGEP)

Patents and other Intellectual properties

Method to determine the extrinsic parameters of a network of various Large-Volume-Metrology sensors. National patent

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Authors

Abstract

Method for the determination of extrinsic parameters (i.e., spatial position and orientation) of various Large-Volume Metrology (LVM) instruments (e.g., laser trackers, rotary-laser automatic theodolites, photogrammetric systems, etc.). This method (denominated "global calibration") can be adapted to the available intruments and specific applications, simplifying the set-up stage significantly.

Tastatore multi-target e modulare per misure dimensionali con diversi strumenti per Large-Volume Metrology (LVM): caratteristiche tecnico-funzionali del dispositivo e procedura matematico-statistica per la localizzazione spaziale dello stesso. National patent

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Authors

Abstract

The invention is a probe, which allows the combined use of LargeVolume Metrology instruments of different nature (laser trackers, rotary-laser automatic theodolites, photogrammetric systems, etc.). The probe has a modular structure and can be customized depending on the specific application and instruments available.

Tastatore intelligente, attivo e modulare per misure fotogrammetriche di oggetti di grandi dimensioni. National and international patent

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Priority number(s): 2016IT-TO09908

Authors

Abstract

The present invention applies to optical measuring systems for the dimensional quality controls in industry. The proposed probe is made of a set of active spherical markers, which do not require external illumination and may be seen by the cameras at any angle. It can be equipped with a series of sensors to monitor the probe kinematic and/or the environmental conditions to enhance or enrich the measurement supplied.